000 01176nam a2200253 a 4500
001 HYC
003 CY-NiGSD
005 20201017150934.0
008 100604s1983 us af ||| |engd
040 _beng
_dΒιβλιοθήκη Τμήματος Γεωλογικής Επισκόπησης
_aCY-NiGSD
082 7 _a549.12
_219th ed.
100 1 _aLind, C. J.
_4aut
_9134400
245 1 0 _aCharacterization of mineral precipitates by electron microscope photographs and electron diffraction patterns /
_cby C. J. Lind.
260 _a[Washington]:
_b[United States Government Printing Office],
_c[1983].
300 _aiv, 18 p. :
_bill., tables ;
_c28 cm.
490 0 _a;
_v2204
504 _aIncludes bibliographical references (p. 17-18).
650 4 _aMineralogy, Determinative
_9134872
650 4 _aElectron microscopy
_9131547
650 4 _aElectrons
_xDiffraction
_9131550
710 0 _aUnited States
_bGovernment Printing Office (U.S. G.P.O)
_4pbl
_9137807
911 _a000881
_e20100604
_j1983
_n549.12 LIN
_p1
_q21
_r0
_s0
942 _2ddc
_cBK
_h549.12 LIN
999 _c76661
_d76661