000 | 01176nam a2200253 a 4500 | ||
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001 | HYC | ||
003 | CY-NiGSD | ||
005 | 20201017150934.0 | ||
008 | 100604s1983 us af ||| |engd | ||
040 |
_beng _dΒιβλιοθήκη Τμήματος Γεωλογικής Επισκόπησης _aCY-NiGSD |
||
082 | 7 |
_a549.12 _219th ed. |
|
100 | 1 |
_aLind, C. J. _4aut _9134400 |
|
245 | 1 | 0 |
_aCharacterization of mineral precipitates by electron microscope photographs and electron diffraction patterns / _cby C. J. Lind. |
260 |
_a[Washington]: _b[United States Government Printing Office], _c[1983]. |
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300 |
_aiv, 18 p. : _bill., tables ; _c28 cm. |
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490 | 0 |
_a; _v2204 |
|
504 | _aIncludes bibliographical references (p. 17-18). | ||
650 | 4 |
_aMineralogy, Determinative _9134872 |
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650 | 4 |
_aElectron microscopy _9131547 |
|
650 | 4 |
_aElectrons _xDiffraction _9131550 |
|
710 | 0 |
_aUnited States _bGovernment Printing Office (U.S. G.P.O) _4pbl _9137807 |
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911 |
_a000881 _e20100604 _j1983 _n549.12 LIN _p1 _q21 _r0 _s0 |
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942 |
_2ddc _cBK _h549.12 LIN |
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999 |
_c76661 _d76661 |